Description: Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties, Hardcover by Dahoo, Pierre Richard; Pougnet, Philippe; El Hami, Abdelkhalak, ISBN 1786306409, ISBN-13 9781786306401, Like New Used, Free shipping in the US To develop innovations in quantum engineering and nanosystems, designers need to adopt the expertise that has been developed in research laboratories. This requires a thorough understanding of the experimental measurement techniques and theoretical models, based on the principles of quantum mechanics. This book presents experimental methods enabling the development and characterization of materials at the nanometer scale, based on practical engineering cases, such as 5G and the interference of polarized light when applied for electromagnetic waves. Using the example of electromechanical, multi-physical coupling in piezoelectric systems, smart materials technology is discussed, with an emphasis on scale reduction and mechanical engineering applications. Statistical analysis methods are presented in terms of their usefulness in systems engineering for experimentation, characterization or design, since safety factors and the most advanced reliability calculation techniques are included from the outset. This book provides valuable support for teachers and researchers but is also intended for engineering students, working engineers and Masters students.
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Book Title: Applications and Metrology at Nanometer Scale 1 : Smart Materials
Item Length: 0.4in
Item Height: 0.4in
Item Width: 0.4in
Author: Abdelkhalak El Hami, Philippe Pougnet, Pierre-Richard Dahoo
Publication Name: Applications and Metrology at Nanometer Scale 1 : Smart Materials, Electromagnetic Waves and Uncertainties
Format: Hardcover
Language: English
Publisher: Wiley & Sons, Incorporated, John
Publication Year: 2021
Type: Textbook
Item Weight: 16 Oz
Number of Pages: 256 Pages
